DocumentCode
896101
Title
Specification of Bipolar LSI Device Input States for Latchup Testing
Author
Erickson, J.J. ; Binder, D.
Author_Institution
Hughes Aircraft Company Culver City, California 90230
Volume
28
Issue
6
fYear
1981
Firstpage
4322
Lastpage
4324
Keywords
Aircraft; Circuit testing; Cities and towns; Large scale integration; Latches; Logic circuits; Logic devices; Logic gates; Optical microscopy; Programmable logic arrays;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4335722
Filename
4335722
Link To Document