DocumentCode :
8965
Title :
Reliability of 1310 nm Wafer Fused VCSELs
Author :
Sirbu, A. ; Suruceanu, G. ; Iakovlev, V. ; Mereuta, A. ; Mickovic, Z. ; Caliman, A. ; Kapon, Eli
Author_Institution :
Laboratory of Physics of Nanostructures, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
Volume :
25
Issue :
16
fYear :
2013
fDate :
Aug.15, 2013
Firstpage :
1555
Lastpage :
1558
Abstract :
Wafer fusion vertical cavity surface emitting laser (VCSEL) technology has produced devices that successfully passed all mechanical and electrical Telcordia qualification tests. Accelerated lifetime tests result in times to 1% failure at 70 
of 18 years and 30 years at VCSEL driving currents of 9 and 8 mA, respectively. These lifetimes meet the telecom industry reliability requirements for applications in fiber-optic communications networks.
Keywords :
Fiber optics; optical communication;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2013.2271041
Filename :
6547199
Link To Document :
