• DocumentCode
    896825
  • Title

    Analytical representations of solid-state devices

  • Author

    Linder, J.S.

  • Volume
    56
  • Issue
    4
  • fYear
    1968
  • fDate
    4/1/1968 12:00:00 AM
  • Firstpage
    745
  • Lastpage
    747
  • Abstract
    Simple expressions for the dependence of hole and electron mobilities upon free carrier densities are utilized to derive equivalent representations of the diode equation as well as other solid-state device equations. The resulting mathematical models vividly display the effects of impurity concentrations in the semiconductor regions on important device parameters.
  • Keywords
    Charge carrier density; Displays; Electron mobility; Equations; Error analysis; P-n junctions; Semiconductor device doping; Semiconductor diodes; Semiconductor process modeling; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1968.6369
  • Filename
    1448299