Title :
High frequency properties of shielded power cable. Part 2: sources of error in measuring shield dielectric properties
Author :
Xu, Chunchuan ; Boggs, S.A.
Author_Institution :
Electr. Insulation Res. Center, Connecticut Univ., USA
Abstract :
This paper provides a theoretical context for the types of errors that are likely to occur during the measurement of high frequency cable shield properties. The paper considers a RC dielectric system as it relates to measuring the dielectric properties of cable shield materials.
Keywords :
cable shielding; dielectric measurement; partial discharge measurement; power cable testing; RC dielectric system; cable shield materials; complex impedance; high frequency cable shield properties; partial discharge testing; power cable shielding; shield dielectric properties measurement; Cable shielding; Dielectric losses; Dielectric measurements; Frequency measurement; Partial discharges; Power cables; Power measurement; Solids; Surface impedance; Voltage;
Journal_Title :
Electrical Insulation Magazine, IEEE
DOI :
10.1109/MEI.2006.1618966
