• DocumentCode
    897619
  • Title

    A Self-Aliglned 1-/spl mu/m-Channel CMOS Technology with Retrograde n-Well and Thin Epitaxy

  • Author

    Taur, Yuan ; Hu, Genda J. ; Dennard, Robert H. ; Terman, Lewis M. ; Ting, Chung-yu ; Petrillo, Karen E.

  • Volume
    20
  • Issue
    1
  • fYear
    1985
  • Firstpage
    123
  • Lastpage
    129
  • Abstract
    A six-mask 1-/spl mu/m CMOS process with many self-aligned features is described. It uses a thin p-type epitaxial layer on a p/sup +/ substrate and a retrograde n-well. Self-aligned TiSi/sub 2/ is formed on n/sup +/ and p/sup +/ diffusions to reduce the sheet resistance and to make butted source contacts. It is shown that n/sup +/ poly-gated p-channel devices can be properly designed with low threshold magnitudes and good turn-off characteristics. With a 5-V supply, the minimum gate delay of unloaded CMOS ring oscillators is 150 ps/stage. Furthermore, it is dernonstrated that this CMOS technology is Iatchup free since the holding voltage for Iatchup is higher than 5 V.
  • Keywords
    CMOS integrated circuits; Integrated circuit technology; Metallisation; Titanium compounds; Boron; CMOS process; CMOS technology; Circuits; Contact resistance; Doping; Epitaxial growth; Implants; MOS devices; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1985.1052284
  • Filename
    1052284