• DocumentCode
    898122
  • Title

    An isolated vertical n-p-n transistor in an n-well CMOS process

  • Author

    Zeitzoff, Peter M. ; Anagnostopoulos, Constantine N. ; Wong, Kwok Y. ; Brandt, Brian P.

  • Volume
    20
  • Issue
    2
  • fYear
    1985
  • fDate
    4/1/1985 12:00:00 AM
  • Firstpage
    489
  • Lastpage
    494
  • Abstract
    Isolated vertical n-p-n transistors were fabricated by a modified 5-/spl mu/m n-well CMOS process. The modification included a decrease in the p/SUP +/ source and drain implant dose and an increase in the final anneal time, but no extra processing steps of masks were required. The n-p-n transistors had generally good characteristics, with H/SUB FE//spl ap/600 and BV/SUB CEO//spl ap/40 V, while the MOS characteristics were unchanged.
  • Keywords
    CMOS integrated circuits; Integrated circuit technology; integrated circuit technology; Annealing; Bipolar transistors; Boron; CMOS process; Driver circuits; Electrical resistance measurement; Implants; MOS devices; MOSFETs; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1985.1052334
  • Filename
    1052334