DocumentCode
898122
Title
An isolated vertical n-p-n transistor in an n-well CMOS process
Author
Zeitzoff, Peter M. ; Anagnostopoulos, Constantine N. ; Wong, Kwok Y. ; Brandt, Brian P.
Volume
20
Issue
2
fYear
1985
fDate
4/1/1985 12:00:00 AM
Firstpage
489
Lastpage
494
Abstract
Isolated vertical n-p-n transistors were fabricated by a modified 5-/spl mu/m n-well CMOS process. The modification included a decrease in the p/SUP +/ source and drain implant dose and an increase in the final anneal time, but no extra processing steps of masks were required. The n-p-n transistors had generally good characteristics, with H/SUB FE//spl ap/600 and BV/SUB CEO//spl ap/40 V, while the MOS characteristics were unchanged.
Keywords
CMOS integrated circuits; Integrated circuit technology; integrated circuit technology; Annealing; Bipolar transistors; Boron; CMOS process; Driver circuits; Electrical resistance measurement; Implants; MOS devices; MOSFETs; Transconductance;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1985.1052334
Filename
1052334
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