• DocumentCode
    898131
  • Title

    Computer-aided design in VLSI device development

  • Author

    Cham, Kit M. ; Oh, Soo-Young ; Moll, John L.

  • Volume
    20
  • Issue
    2
  • fYear
    1985
  • fDate
    4/1/1985 12:00:00 AM
  • Firstpage
    495
  • Lastpage
    500
  • Abstract
    Computer-aided design (CAD) has been used extensively in the development of VLSI MOS technology at Hewlett-Packard Laboratory. The CAD system for MOS device design is described. The development of the p-channel transistor with submicrometer channel length, trench isolation in CMOS, and side-wall-masked isolation (SWAMI) for VLSI technology are then presented, followed by a discussion of the techniques used in the simulation of parasitic capacitances in multilayer interconnects for circuit performance evaluations.
  • Keywords
    Circuit CAD; Field effect integrated circuits; Integrated circuit technology; VLSI; circuit CAD; field effect integrated circuits; integrated circuit technology; CMOS technology; Circuit simulation; Design automation; Integrated circuit interconnections; Isolation technology; Laboratories; MOS devices; Nonhomogeneous media; Parasitic capacitance; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1985.1052335
  • Filename
    1052335