DocumentCode
898131
Title
Computer-aided design in VLSI device development
Author
Cham, Kit M. ; Oh, Soo-Young ; Moll, John L.
Volume
20
Issue
2
fYear
1985
fDate
4/1/1985 12:00:00 AM
Firstpage
495
Lastpage
500
Abstract
Computer-aided design (CAD) has been used extensively in the development of VLSI MOS technology at Hewlett-Packard Laboratory. The CAD system for MOS device design is described. The development of the p-channel transistor with submicrometer channel length, trench isolation in CMOS, and side-wall-masked isolation (SWAMI) for VLSI technology are then presented, followed by a discussion of the techniques used in the simulation of parasitic capacitances in multilayer interconnects for circuit performance evaluations.
Keywords
Circuit CAD; Field effect integrated circuits; Integrated circuit technology; VLSI; circuit CAD; field effect integrated circuits; integrated circuit technology; CMOS technology; Circuit simulation; Design automation; Integrated circuit interconnections; Isolation technology; Laboratories; MOS devices; Nonhomogeneous media; Parasitic capacitance; Very large scale integration;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1985.1052335
Filename
1052335
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