• DocumentCode
    898237
  • Title

    Large-capacity semiconductor memory

  • Author

    Hodges, David A.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Murray Hill, N. J.
  • Volume
    56
  • Issue
    7
  • fYear
    1968
  • fDate
    7/1/1968 12:00:00 AM
  • Firstpage
    1148
  • Lastpage
    1162
  • Abstract
    Integrated-circuit memories using bipolar transistor technology are compared with memories based on various forms of the insulated-gate field-effect transistor (IGFET). A combination of p-channel IGFET memory cells with bipolar transistor access circuits appears to offer a desirable combination of characteristics. Memory organization, chip design, packaging, and interconnection alternatives are considered. Beam-lead sealed-junction technology has significant advantages over other packaging and interconnection technologies in the realization of semiconductor memory. Some of the problems expected in the design of a million-bit computer memory are examined with attention to power dissipation, interconnections, reliability, maintainability, and cost. Finally, the potential characteristics of a million-bit semiconductor memory based on today´s technology are compared with the characteristics of ferrite core, planar film, and cylindrical film magnetic memories. The conclusion drawn from this exploratory study is that semiconductor memory has attractive potential for both small- and large-capacity memory applications.
  • Keywords
    FETs; Ferrite films; Insulated gate bipolar transistors; Insulation; Integrated circuit interconnections; Integrated circuit technology; Magnetic films; Semiconductor device packaging; Semiconductor films; Semiconductor memory;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1968.6512
  • Filename
    1448442