DocumentCode
898408
Title
Correlation between DLTS-Measurements and the Performance of High Purity Germanium Detectors
Author
Simoen, E. ; Clauws, P. ; Broeckx, J. ; Vennik, J. ; Sande, M. Van ; Laet, L. De
Author_Institution
Rijksuniversiteit Gent, Krijgslaan 271, B-9000 Gent (Belgium)
Volume
29
Issue
1
fYear
1982
Firstpage
789
Lastpage
792
Abstract
Deep acceptor levels in high-purity detector-grade Germanium (p-type) were studied by Deep Level Transient Spectroscopy (DLTS). A correlation was found between the total concentration of electrical active copper-defects and detector resolution. The role of dislocations, vacancy- and oxygen related defects is less clear. The presence of high local concentrations of trapping centers in some crystals has been demonstrated. In general DLTS has shown to be a very powerfull tool for the evaluation of the detector quality of high-purity Germanium.
Keywords
Capacitance; Coaxial components; Detectors; Diodes; Energy resolution; Germanium; Helium; Impurities; Spectroscopy; Temperature measurement;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1982.4335960
Filename
4335960
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