DocumentCode
898684
Title
Calculation of the net and parasitic capacitances of diffused junctions
Author
Szabo, B.A.
Volume
56
Issue
7
fYear
1968
fDate
7/1/1968 12:00:00 AM
Firstpage
1250
Lastpage
1251
Abstract
Junction capacitance measured at two reverse voltages is sufficient to calculate the parasitic and the net junction capacitances of a transistor or diode. Use of a nomograph further simplifies the calculation.
Keywords
Capacitance measurement; Diodes; Infrared detectors; Laser beams; Laser radar; Laser theory; Parasitic capacitance; Physics; Temperature; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1968.6555
Filename
1448485
Link To Document