DocumentCode :
900157
Title :
An enhanced fully scaled 1.2-μm CMOS process for analog
Author :
Reich, Robert K. ; Rahn, Curt H. ; Holt, Mark S. ; Schrankler, Jay W. ; Ju, Dong-Hyuk ; Kirchner, Gary D.
Volume :
21
Issue :
2
fYear :
1986
fDate :
4/1/1986 12:00:00 AM
Firstpage :
293
Lastpage :
296
Abstract :
An n-well CMOS technology has been developed for high-speed/precision 10-V analog operation while retaining VLSI packaging densities and performance. Several enhancements to a fully scaled 1.2-μm CMOS process were made to attain performance levels necessary for state-of-the-art data-conversion applications. The technology incorporates components essential for analog circuit design such as high-gain/low-noise n-p-n BJTs, laser trimmable Cr-Si resistors, and extremely accurate interpoly oxide capacitors. Inclusion of an optimized LDD structure on n-channel transistors has permitted 10-V CMOS capabilities down to 2.5-μm drawn gate lengths.
Keywords :
Analogue-digital conversion; CMOS integrated circuits; Digital-analogue conversion; Integrated circuit technology; Linear integrated circuits; analogue-digital conversion; digital-analogue conversion; integrated circuit technology; linear integrated circuits; Bipolar transistors; CMOS process; CMOS technology; Capacitors; Degradation; Fabrication; Implants; Laser tuning; MOSFET circuits; Resistors;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1986.1052517
Filename :
1052517
Link To Document :
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