Title :
A simple measurement method to determine the burst acquisition time of digital systems
Author :
Hatamoto, Curtis ; Fu, Huajing ; Feher, Kamilo
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
fDate :
6/1/1996 12:00:00 AM
Abstract :
A cost-efficient solution for measuring fast and ultrafast synchronization-caused bit errors is disclosed. This invention enables the user to modify conventional test instruments and to eliminate the need to obtain very expensive test equipment. Our new instrumentation implementation concept comprises a gated switch added to a pseudorandom bit sequence generator and analyzer. The synchronization time of a couple of circuits is tested
Keywords :
data acquisition; synchronisation; time measurement; bit errors; burst acquisition time measurement; circuits; digital systems; gated switch; pseudorandom bit sequence generator; test instrumentation; ultrafast synchronization; Circuit testing; Computer errors; Delay; Digital systems; Electrical resistance measurement; Frequency conversion; Frequency estimation; Frequency synchronization; Prototypes; Time measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
