• DocumentCode
    901457
  • Title

    Measurement of Dielectric Materials Using a Cutoff Circuiar-Waveguide Cavity (Short Papers)

  • Author

    Hanfling, J. ; Botte, L.

  • Volume
    20
  • Issue
    3
  • fYear
    1972
  • fDate
    3/1/1972 12:00:00 AM
  • Firstpage
    233
  • Lastpage
    235
  • Abstract
    A technique is presented for accurately determinhg the dielectric constant of microwave materials. The concept is to resonate a cutoff circular-waveguide cavity by inserting the dielectric-disk sample. Unlike most dielectric measurement techniques which rely on perturbation methods, this one determines the dielectric constant from the absolute measurement of the resonant frequency. Also, the use of a cutoff cavity prevents false dielectric constant readings by eliminating spurious resonances.
  • Keywords
    Admittance; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Rectangular waveguides; Resonance; Resonant frequency; Testing; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1972.1127722
  • Filename
    1127722