DocumentCode
901457
Title
Measurement of Dielectric Materials Using a Cutoff Circuiar-Waveguide Cavity (Short Papers)
Author
Hanfling, J. ; Botte, L.
Volume
20
Issue
3
fYear
1972
fDate
3/1/1972 12:00:00 AM
Firstpage
233
Lastpage
235
Abstract
A technique is presented for accurately determinhg the dielectric constant of microwave materials. The concept is to resonate a cutoff circular-waveguide cavity by inserting the dielectric-disk sample. Unlike most dielectric measurement techniques which rely on perturbation methods, this one determines the dielectric constant from the absolute measurement of the resonant frequency. Also, the use of a cutoff cavity prevents false dielectric constant readings by eliminating spurious resonances.
Keywords
Admittance; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Rectangular waveguides; Resonance; Resonant frequency; Testing; Wavelength measurement;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1972.1127722
Filename
1127722
Link To Document