DocumentCode :
901457
Title :
Measurement of Dielectric Materials Using a Cutoff Circuiar-Waveguide Cavity (Short Papers)
Author :
Hanfling, J. ; Botte, L.
Volume :
20
Issue :
3
fYear :
1972
fDate :
3/1/1972 12:00:00 AM
Firstpage :
233
Lastpage :
235
Abstract :
A technique is presented for accurately determinhg the dielectric constant of microwave materials. The concept is to resonate a cutoff circular-waveguide cavity by inserting the dielectric-disk sample. Unlike most dielectric measurement techniques which rely on perturbation methods, this one determines the dielectric constant from the absolute measurement of the resonant frequency. Also, the use of a cutoff cavity prevents false dielectric constant readings by eliminating spurious resonances.
Keywords :
Admittance; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Rectangular waveguides; Resonance; Resonant frequency; Testing; Wavelength measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1972.1127722
Filename :
1127722
Link To Document :
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