Title :
Measurement of Dielectric Materials Using a Cutoff Circuiar-Waveguide Cavity (Short Papers)
Author :
Hanfling, J. ; Botte, L.
fDate :
3/1/1972 12:00:00 AM
Abstract :
A technique is presented for accurately determinhg the dielectric constant of microwave materials. The concept is to resonate a cutoff circular-waveguide cavity by inserting the dielectric-disk sample. Unlike most dielectric measurement techniques which rely on perturbation methods, this one determines the dielectric constant from the absolute measurement of the resonant frequency. Also, the use of a cutoff cavity prevents false dielectric constant readings by eliminating spurious resonances.
Keywords :
Admittance; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Rectangular waveguides; Resonance; Resonant frequency; Testing; Wavelength measurement;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1972.1127722