DocumentCode
901498
Title
Noise considerations in high-accuracy A/D converters
Author
Yee, Philip W.
Volume
21
Issue
6
fYear
1986
fDate
12/1/1986 12:00:00 AM
Firstpage
1011
Lastpage
1015
Abstract
The increased resolution of A/D converters makes it virtually impossible to follow the old design rules that dictated the noise of converter systems should be much less than the value of the least significant bit. The response of a successive-approximation MOS A/D converter system to noise is examined and an expression is derived for the distribution of output codes as a function of the noise. Because of the way a successive approximation register-type converter works, the distribution of codes is found to be non-Gaussian, with a nonmonotonic decay as one moves away from the principal mode of the distribution. The derived expression is found to be in excellent agreement with experimental results. The average value of the distribution of output codes is calculated and found not to be equal to the output code obtained from a noise-free converter. New designs with high-accuracy A/D converters must take into account the expected distribution of output codes rather than simply assuming that one will always get the `right´ answer. Averaging over many conversion cycles will not remove all the effects of the noise.
Keywords
Analogue-digital conversion; Electron device noise; Field effect integrated circuits; Random noise; analogue-digital conversion; electron device noise; field effect integrated circuits; random noise; Circuit noise; Equations; Frequency response; Noise cancellation; Noise level; Probability distribution; Sampling methods; Semiconductor device noise; Voltage; White noise;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1986.1052643
Filename
1052643
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