• DocumentCode
    901500
  • Title

    Charging and Discharging Characteristics of Dielectric Materials Exposed to Low- and Mid-Energy Electrons

  • Author

    Coakley, P. ; Kitterer, B. ; Treadaway, M.

  • Author_Institution
    JAYCOR, San Diego, CA
  • Volume
    29
  • Issue
    6
  • fYear
    1982
  • Firstpage
    1639
  • Lastpage
    1643
  • Abstract
    Samples of dielectric materials have been irradiated with low- (1 to 25 keV) and mid-energy (25 to 100 keV) electrons. Charging and discharging characteristics for samples of OSR, mylar, Kapton, perforated Kapton and Alphaquartz are discussed. Results of tests conducted with monoenergetic midenergy electrons indicate that the worst-case peak discharge current, Is, is relatively constant with exposure energy; that dls/dt is relatively constant with exposure energy; and that the predischarge surface potential, Vi, is only a weak function of energy. Results of irradiating samples of OSR, mylar, and Kapton with low-energy and mid-energy electrons indicate that the surface potential may be tailored to low values (Vs <2 kV) and yet still achieve discharges (on OSR and mylar samples), and that for an OSR sample, the frequency content of these discharges is much higher than for discharges observed during exposure to monoenergetic low-energy electrons alone.
  • Keywords
    Dielectric materials; Dielectric substrates; Electrons; Geometry; Laboratories; Performance evaluation; Satellites; Surface charging; Surface discharges; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1982.4336419
  • Filename
    4336419