Hardness Assurance Experience on the DSCS III Spacecraft Program

This paper describes hardness assurance experience gained during the production of three DSCS (Defense Satellite Communications System) III spacecraft. The program approach is applicable to both natural space and nuclear explosive radiation environments. This hardness assurance program included semiconductor lot sample tests and latchup screening of certain integrated circuits. The lot sample testing included both displacement damage and ionization damage induced by reactor and Cobalt-60 sources, respectively, and prompt dose testing using high level flash x-ray (FXR) exposure. Test results and resolution of failed lots are discussed. Significant observations and issues for future technology studies are presented in the areas of both displacement and ionization damage, prompt dose stress (burnout) and latchup.