Title :
Barrier-height determinations in thin-film tunnel junctions
Author :
Tosser, A. ; Cormier, J.C. ; Thureau, P.
Author_Institution :
Université de Caen, Laboratoire de Physique Experimentale, Caen, France
fDate :
8/1/1966 12:00:00 AM
Abstract :
Using the previously determined value of the internal electric field of tunnel diodes, the authors use the electric tunnel method for the evaluation of metal¿dielectric barrier heights. Effective mass of electron and dielectric permittivity are constant for a range of thickness from 50 to 150 Å.
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19660257
