• DocumentCode
    902873
  • Title

    RF CMOS low-phase-noise LC oscillator through memory reduction tail transistor

  • Author

    Boon, C.C. ; Do, M.A. ; Yeo, K.S. ; Ma, J.G. ; Zhang, X.L.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
  • Volume
    51
  • Issue
    2
  • fYear
    2004
  • fDate
    2/1/2004 12:00:00 AM
  • Firstpage
    85
  • Lastpage
    90
  • Abstract
    Based on the understanding of flicker noise generation in "silicon metal-oxide semiconductor field-effect transistors" (MOSFETs), a novel method for improving the phase noise performance of a CMOS LC oscillator is presented. Zhou et al. and Hoogee have suggested that the 1/f noise can be reduced through a switched gate, and the flicker noise generated is inversely proportional to the gate switching frequency. The novel tail transistor topology is compared to the two popular tail transistor topologies, namely, the fixed biasing tail transistor and without tail transistor. Through this technique, a figure of merit of 193 dB is achieved using a fully integrated CMOS oscillator with a tank quality factor of about 9.
  • Keywords
    CMOS integrated circuits; MOSFET; field effect transistors; network topology; oscillators; 1-f noise; CMOS LC oscillator; CMOS oscillator; RF CMOS low-phase-noise LC oscillator; fixed biasing tail transistor; flicker noise; gate switching frequency; memory reduction tail transistor; phase noise performance; silicon metal-oxide semiconductor field-effect transistors; switched gate; tail transistor topology; tank quality factor; 1f noise; FETs; MOS devices; MOSFETs; Oscillators; Phase noise; Radio frequency; Silicon; Tail; Topology;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2003.821519
  • Filename
    1268240