DocumentCode
902873
Title
RF CMOS low-phase-noise LC oscillator through memory reduction tail transistor
Author
Boon, C.C. ; Do, M.A. ; Yeo, K.S. ; Ma, J.G. ; Zhang, X.L.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume
51
Issue
2
fYear
2004
fDate
2/1/2004 12:00:00 AM
Firstpage
85
Lastpage
90
Abstract
Based on the understanding of flicker noise generation in "silicon metal-oxide semiconductor field-effect transistors" (MOSFETs), a novel method for improving the phase noise performance of a CMOS LC oscillator is presented. Zhou et al. and Hoogee have suggested that the 1/f noise can be reduced through a switched gate, and the flicker noise generated is inversely proportional to the gate switching frequency. The novel tail transistor topology is compared to the two popular tail transistor topologies, namely, the fixed biasing tail transistor and without tail transistor. Through this technique, a figure of merit of 193 dB is achieved using a fully integrated CMOS oscillator with a tank quality factor of about 9.
Keywords
CMOS integrated circuits; MOSFET; field effect transistors; network topology; oscillators; 1-f noise; CMOS LC oscillator; CMOS oscillator; RF CMOS low-phase-noise LC oscillator; fixed biasing tail transistor; flicker noise; gate switching frequency; memory reduction tail transistor; phase noise performance; silicon metal-oxide semiconductor field-effect transistors; switched gate; tail transistor topology; tank quality factor; 1f noise; FETs; MOS devices; MOSFETs; Oscillators; Phase noise; Radio frequency; Silicon; Tail; Topology;
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2003.821519
Filename
1268240
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