• DocumentCode
    904007
  • Title

    Analysis of MOS transformer-coupled oscillators

  • Author

    Mayaram, Kartikeya ; Pederson, Donald O.

  • Volume
    22
  • Issue
    6
  • fYear
    1987
  • fDate
    12/1/1987 12:00:00 AM
  • Firstpage
    1155
  • Lastpage
    1162
  • Abstract
    Techniques for estimating the steady-state voltage amplitudes of MOS transformer-coupled oscillators are presented. A noniterative procedure based on equations and graphical data is used and no simulations are required. By appropriate normalization of variables, the graphical data can be applied to arbitrary transistor sizes and bias conditions. Both single-ended and source-coupled configurations are analyzed. A simple analysis is presented for the squegging phenomenon which exists in single-ended stages. This analysis is used to determine the condition for avoiding squegging. Comparisons are made with SPICE2 simulations and good agreement is achieved over a wide range of operation.
  • Keywords
    Field effect integrated circuits; Nonlinear network analysis; Oscillators; field effect integrated circuits; nonlinear network analysis; oscillators; Amplitude estimation; Bipolar transistors; Circuit faults; Circuit simulation; MOS devices; Oscillators; Prototypes; Steady-state; Thermal resistance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1987.1052868
  • Filename
    1052868