DocumentCode
904302
Title
Quantum Efficiency Analysis of InAs–GaSb Type-II Superlattice Photodiodes
Author
Mou, Shin ; Li, Jian V. ; Chuang, Shun Lien
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL
Volume
45
Issue
6
fYear
2009
fDate
6/1/2009 12:00:00 AM
Firstpage
737
Lastpage
743
Abstract
We compare the experimentally measured and theoretically calculated quantum efficiency (QE), where an analytical drift-diffusion photocurrent model is used, of n+ -on-p InAs-GaSb superlattice (SL) photodiodes. With inputs of the transport parameters obtained by the electron-beam-induced current technique and absorption coefficient spectra calculated by the eight-band kldrp method for the p-SL, n+ -SL, and depletion region, taking into account the band filling effect, we show that the drift-diffusion photocurrent model is a good approximation for the InAs-GaSb type-II SL photodiodes, which implies that the SL depletion region in InAs-GaSb SL photodiodes is as effective as that in bulk semiconductor photodiodes in terms of collecting the photo-excited electron-hole pairs. Using this theoretical model, we also find that the high doping density in n-type SL degrades the QE by reducing the absorption coefficient. As a result, the n-type doping density is suggested to be below 1times1017cm-3 in order to optimize the QE for the studied InAs-GaSb SL photodiodes.
Keywords
EBIC; III-V semiconductors; doping profiles; gallium compounds; indium compounds; photoconductivity; photodiodes; photoexcitation; semiconductor diodes; InAs-GaSb; SL depletion region; absorption coefficient spectra; analytical drift-diffusion photocurrent model; band filling effect; bulk semiconductor photodiode; eight-band kmiddotp method; electron-beam-induced current technique; high doping density; n-type doping density; photo-excited electron-hole pairs; quantum efficiency analysis; type-II superlattice photodiodes; Absorption; Analytical models; Degradation; Filling; Photoconductivity; Photodiodes; Quantum mechanics; Semiconductor device doping; Semiconductor process modeling; Superlattices; Optical absorption; photodetectors; semiconductor device modeling; semiconductor superlattices (SLs);
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2009.2013149
Filename
4957553
Link To Document