• DocumentCode
    904707
  • Title

    Inductance and Resistance Calculations in Three-Dimensional Packaging Using Cylindrical Conduction-Mode Basis Functions

  • Author

    Han, Ki Jin ; Swaminathan, Madhavan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
  • Volume
    28
  • Issue
    6
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    846
  • Lastpage
    859
  • Abstract
    For the successful electrical design of system-in-package, this paper proposes an efficient method for extracting wideband resistance and inductance from a large number of 3-D interconnections. The proposed method uses the modal equivalent network from the electric field integral equation with cylindrical conduction-mode basis function, which reduces the matrix size for large 3-D interconnection problems. Additional enhancement schemes proposed further reduce the cost for computing the partial inductances. Therefore, the method discussed in this paper can be used to construct accurate models of a large number of 3-D interconnection structures such as more than 100 bonding wires used for stacking chips.
  • Keywords
    electrical resistivity; integral equations; integrated circuit bonding; integrated circuit interconnections; microprocessor chips; system-in-package; 3-D interconnections; 3D packaging; bonding wires; cylindrical conduction-mode basis function; cylindrical conduction-mode basis functions; electric field integral equation; inductance calculation; modal equivalent network; resistance calculation; stacking chips; system-in-package; wideband inductance; wideband resistance; Bonding wires; cylindrical conduction-mode basis function (CMBF); electric field integral equation (EFIE); partial element equivalent circuit (PEEC) method; proximity effect (PE); skin effect (SE); system-in-package (SIP); through-hole via (THV) interconnections;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2009.2016642
  • Filename
    4957598