• DocumentCode
    904863
  • Title

    Domain conversion under high frequency excitation in inductive thin film heads

  • Author

    Trouilloud, P.L. ; Argyle, B.E. ; Petek, B. ; Herman, D.A.

  • Author_Institution
    IBM, Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    25
  • Issue
    5
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    3461
  • Lastpage
    3463
  • Abstract
    A magnetooptic microscope was used to observe the time-averaged magnetization distribution in an inductive thin-film head excited by continuous sine waves. Domain activity in yokes driven with sinusoidal currents (1 to 20 MHz) was observed using the Kerr effect at video frame rates (0 to 30 Hz). Thus, the average location and shape of domains in the top yoke of the head could be recorded. It is shown that the domain pattern generally undergoes significant changes in a slow, repeatable evolution. Some changes lead to abrupt conversions of domain states. Although specific behavior varies from head to head, these conversions follow measurable curves having a common trend in the amplitude versus frequency space. Previous work on analysis of head response has not considered this type of dynamic response, although it appears to be common to many magnetic system. In addition to possible response at the excitation frequency, the wall network can also undergo large changes with a time scale much longer than the excitation period. Three possible mechanisms driving the domain conversions are outlined
  • Keywords
    magnetic domain walls; magnetic heads; magnetic thin film devices; magnetisation; 1 to 20 MHz; Kerr effect; continuous sine waves; domain activity; domain conversion; domain pattern; dynamic response; excitation period; head response; high frequency excitation; inductive thin film heads; magnetooptic microscope; time-averaged magnetization distribution; video frame rates; wall network; yokes; Extraterrestrial measurements; Frequency conversion; Frequency measurement; Kerr effect; Magnetic force microscopy; Magnetic heads; Magnetization; Magnetooptic effects; Shape; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.42335
  • Filename
    42335