Title :
Lifetime measurements on step-recovery diodes using sinusoidal input
Author :
Roulston, D.J. ; Hanson, Jutta
fDate :
6/1/1969 12:00:00 AM
Abstract :
By applying a sinusoidal voltage of known frequency to a p+-n-n+structure of narrow n region and adjusting the dc bias to optimize the output component of a given harmonic in a resistive circuit, the lifetime may be obtained directly from a given set of computed curves.
Keywords :
Charge carrier lifetime; Equations; Frequency; Harmonic analysis; Lifetime estimation; P-i-n diodes; Power system harmonics; Pulse circuits; Solids; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1969.7193
