DocumentCode
906061
Title
Measurement of losses in five piezoelectric ceramics between 2 and 50 MHz
Author
Lethiecq, Marc ; Patat, Frederick ; Pourcelot, Leandre ; Tran-Huu-Hue, Louis P.
Author_Institution
GIP Ultrasons, Tours, France
Volume
40
Issue
3
fYear
1993
fDate
5/1/1993 12:00:00 AM
Firstpage
232
Lastpage
237
Abstract
Approximate formulas including losses to predict the electrical impedance of a thin unloaded piezoelectric plate around antiresonant frequencies of the thickness modes have been derived. To do so, a total loss factor is defined that includes both mechanical and electrical losses. Complex electrical impedance measurements on a lead metaniobate and four PZT-type materials between 2 and 50 MHz have been performed. The total loss factors were deduced from both the peak real impedance and from the -6 dB bandwidth of the real impedance peak. Results for fundamental and harmonic thickness modes on thin plates are discussed and the five materials are compared. It is found that for these piezoceramics the total loss factor is well approximated by a linear function of frequency. Finally, a frequency-dependent loss factor is included in the KLM equivalent circuit and it is shown that the theoretical impedance curves obtained with this model are in good agreement with measurements.<>
Keywords
ceramics; dielectric loss measurement; electric impedance measurement; lead compounds; piezoelectric materials; 2 to 50 MHz; KLM equivalent circuit; PZT; PbNbO/sub 3/; PbZrO3TiO3; antiresonant frequencies; electrical impedance measurements; electrical losses; frequency-dependent loss factor; harmonic thickness modes; mechanical losses; piezoelectric ceramics; thickness modes; thin unloaded piezoelectric plate; total loss factor; Ceramics; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Equivalent circuits; Frequency measurement; Impedance measurement; Loss measurement; Piezoelectric materials; Piezoelectric transducers;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.216836
Filename
216836
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