Title :
Computation of fields and forces in magnetic force microscopy
Author_Institution :
Opt. Sci. Center, Arizona Univ., Tucson, AZ, USA
fDate :
9/1/1989 12:00:00 AM
Abstract :
In magnetic force microscopy (MFM), a sharp magnetic needle interacts with the field pattern established by the sample near its surface. A cantilever then converts the force on the needle to a displacement, which is measured interferometrically or otherwise. The author describes a model for the tip that takes full account of the micromagnetic interactions involved. The stray magnetic field for a thin film is computed, and the micromagnetic model of the needle is developed. An example calculation is given to illustrate the application of the model
Keywords :
atomic force microscopy; magnetic domains; magnetic fields; magnetisation; scanning tunnelling microscopy; cantilever; field pattern; magnetic force microscopy; magnetisation; micromagnetic interactions; micromagnetic model; sharp magnetic needle; stray magnetic field; Crystallization; Magnetic domain walls; Magnetic domains; Magnetic force microscopy; Magnetic forces; Magnetic separation; Magnetization; Micromagnetics; Needles; Optical microscopy;
Journal_Title :
Magnetics, IEEE Transactions on
