DocumentCode :
906400
Title :
Solid state reliability
Author :
Battin, John W.
Author_Institution :
Motorola, Inc., Chicago, Ill.
Volume :
15
Issue :
1
fYear :
1966
fDate :
3/1/1966 12:00:00 AM
Firstpage :
1
Lastpage :
5
Keywords :
Art; Degradation; Electron tubes; Impedance; Maintenance; Oscillators; Relays; Reliability engineering; Solid state circuits; Temperature;
fLanguage :
English
Journal_Title :
IEEE Transactions on Vehicular Communications
Publisher :
ieee
ISSN :
0096-2503
Type :
jour
DOI :
10.1109/TVC.1966.33017
Filename :
1621827
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=906400
