• DocumentCode
    906490
  • Title

    Method of obstacle admittance measurement in below-cutoff waveguides

  • Author

    Mok, C.K.

  • Author_Institution
    Standard Telecommunication Laboratories, Harlow, UK
  • Volume
    6
  • Issue
    3
  • fYear
    1970
  • Firstpage
    50
  • Lastpage
    51
  • Abstract
    This letter describes a slotted-line admittance measurement of thin obstacles in waveguides operated below the H10 cutoff frequency. Two measurements are required to yield a result. Experimental results for two different obstacles are given.
  • Keywords
    admittance measurement; waveguides;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19700033
  • Filename
    4234519
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=906490