Title :
From Chapman-Robbins bound towards Barankin bound in threshold behaviour prediction
Author :
Atallah, L.N. ; Barbot, J.-P. ; Larzabal, P.
Author_Institution :
Lab. SATIE, Ecole Normale Superieure de Cachan, France
fDate :
2/1/2004 12:00:00 AM
Abstract :
The evolution of the Barankin bound and the threshold behaviour occurrence with the number of test points for which the bias is constrained to be null is studied. It is first shown that the Barankin bound is an increasing function of the number of test points used in its computation. This result is further used to characterise the threshold occurrence evolution with the number of test points.
Keywords :
mean square error methods; signal processing; Barankin bound; Chapman-Robbins bound;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20040152
