Title :
The determination of device noise parameters
Abstract :
A novel noise measurement technique is outlined which results in data that directly give the noise parameters of the test device when processed by a simple computer program.
Keywords :
Character generation; Circuit noise; Current-voltage characteristics; Diodes; Frequency conversion; Noise figure; Resistors; Steady-state; Switching circuits; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1969.7311
