• DocumentCode
    908303
  • Title

    Switch-level timing verification for CMOS circuits: a semianalytic approach

  • Author

    Yang, H.G. ; Holburn, D.M.

  • Author_Institution
    Dept. of Eng., Cambridge Univ., UK
  • Volume
    137
  • Issue
    6
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    405
  • Lastpage
    412
  • Abstract
    The authors describe a semianalytic slope delay model for CMOS switch-level timing verification. It is characterised by classification of the effects of the input slope, internal size and load capacitance of a logic gate on delay time, and then the use of a series of carefully chosen analytic functions to estimate delay times under different circumstances. In the field of VLSI analysis, this model achieves improvements in speed and accuracy compared with conventional approaches to transistor-level and switch-level simulation
  • Keywords
    CMOS integrated circuits; VLSI; delays; switching circuits; CMOS circuits; CMOS switch-level timing verification; VLSI analysis; analytic functions; delay time; distributed stage; input slope effect; internal size effect; load capacitance effect; logic gate; lumped stage; ring modulation; semianalytic approach; switch-level simulation; transistor-level;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings G
  • Publisher
    iet
  • ISSN
    0956-3768
  • Type

    jour

  • Filename
    217126