• DocumentCode
    908489
  • Title

    Fluidic packaging of microengine and microrocket devices for high-pressure and high-temperature operation

  • Author

    Peles, Yoav ; Srikar, V.T. ; Harrison, Todd S. ; Protz, Christopher ; Mracek, Anna ; Spearing, S. Mark

  • Author_Institution
    Dept. of Mech., Rensselaer Polytech. Inst., Troy, NY, USA
  • Volume
    13
  • Issue
    1
  • fYear
    2004
  • Firstpage
    31
  • Lastpage
    40
  • Abstract
    The fluidic packaging of Power MEMS devices such as the MIT microengine and microrocket requires the fabrication of hermetic seals capable of withstanding temperature in the range 20-600°C and pressures in the range 100-300 atm. We describe an approach to such packaging by attaching Kovar metal tubes to a silicon device using glass seal technology. Failure due to fracture of the seals is a significant reliability concern in the baseline process: microscopy revealed a large number of voids in the glass, pre-cracks in the glass and silicon, and poor wetting of the glass to silicon. The effects of various processing and materials parameters on these phenomena were examined. A robust procedure, based on the use of metal-coated silicon substrates, was developed to ensure good wetting. The bending strength of single-tube specimens was determined at several temperatures. The dominant failure mode changed from fracture at room temperature to yielding of the glass and Kovar at 600°C. The strength in tension at room temperature was analyzed using Weibull statistics; these results indicate a probability of survival of 0.99 at an operational pressure of 125 atm at room temperature for single tubes and a corresponding probability of 0.9 for a packaged device with 11 joints. The residual stresses were analyzed using the method of finite elements and recommendations for the improvement of packaging reliability are suggested.
  • Keywords
    Weibull distribution; bending strength; finite element analysis; fracture toughness; hermetic seals; internal stresses; microfluidics; rocket engines; thermal expansion; thermal management (packaging); 100 to 300 atm; 20 to 600 C; Kovar metal tubes; Weibull statistics; bending strength; finite elements; fluidic packaging; glass seal technology; hermetic seals; high-pressure operation; high-temperature operation; metal-coated silicon substrates; microengine; microrocket; packaging reliability; power MEMS devices; residual stresses; yielding; Fabrication; Fluidic microsystems; Glass; Microelectromechanical devices; Microfluidics; Packaging; Probability; Seals; Silicon; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2003.823223
  • Filename
    1269729