DocumentCode
908489
Title
Fluidic packaging of microengine and microrocket devices for high-pressure and high-temperature operation
Author
Peles, Yoav ; Srikar, V.T. ; Harrison, Todd S. ; Protz, Christopher ; Mracek, Anna ; Spearing, S. Mark
Author_Institution
Dept. of Mech., Rensselaer Polytech. Inst., Troy, NY, USA
Volume
13
Issue
1
fYear
2004
Firstpage
31
Lastpage
40
Abstract
The fluidic packaging of Power MEMS devices such as the MIT microengine and microrocket requires the fabrication of hermetic seals capable of withstanding temperature in the range 20-600°C and pressures in the range 100-300 atm. We describe an approach to such packaging by attaching Kovar metal tubes to a silicon device using glass seal technology. Failure due to fracture of the seals is a significant reliability concern in the baseline process: microscopy revealed a large number of voids in the glass, pre-cracks in the glass and silicon, and poor wetting of the glass to silicon. The effects of various processing and materials parameters on these phenomena were examined. A robust procedure, based on the use of metal-coated silicon substrates, was developed to ensure good wetting. The bending strength of single-tube specimens was determined at several temperatures. The dominant failure mode changed from fracture at room temperature to yielding of the glass and Kovar at 600°C. The strength in tension at room temperature was analyzed using Weibull statistics; these results indicate a probability of survival of 0.99 at an operational pressure of 125 atm at room temperature for single tubes and a corresponding probability of 0.9 for a packaged device with 11 joints. The residual stresses were analyzed using the method of finite elements and recommendations for the improvement of packaging reliability are suggested.
Keywords
Weibull distribution; bending strength; finite element analysis; fracture toughness; hermetic seals; internal stresses; microfluidics; rocket engines; thermal expansion; thermal management (packaging); 100 to 300 atm; 20 to 600 C; Kovar metal tubes; Weibull statistics; bending strength; finite elements; fluidic packaging; glass seal technology; hermetic seals; high-pressure operation; high-temperature operation; metal-coated silicon substrates; microengine; microrocket; packaging reliability; power MEMS devices; residual stresses; yielding; Fabrication; Fluidic microsystems; Glass; Microelectromechanical devices; Microfluidics; Packaging; Probability; Seals; Silicon; Temperature distribution;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2003.823223
Filename
1269729
Link To Document