• DocumentCode
    910128
  • Title

    The effects of unsymmetric matrix permutations and scalings in semiconductor device and circuit simulation

  • Author

    Schenk, Olaf ; Rollin, S. ; Gupta, Anshul

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    23
  • Issue
    3
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    400
  • Lastpage
    411
  • Abstract
    The solution of large sparse unsymmetric linear systems is a critical and challenging component of semiconductor device and circuit simulations. The time for a simulation is often dominated by this part. The sparse solver is expected to balance different, and often conflicting requirements. Reliability, a low memory-footprint, and a short solution time are a few of these demands. Currently, no black-box solver exists that can satisfy all criteria. The linear systems from both simulations can be highly ill-conditioned and are, therefore, quite challenging for direct and iterative methods. In this paper, it is shown that algorithms to place large entries on the diagonal using unsymmetric permutations and scalings greatly enhance the reliability of both direct and preconditioned iterative solvers for unsymmetric linear systems arising in semiconductor device and circuit simulations. The numerical experiments indicate that the overall solution strategy is both reliable and cost effective.
  • Keywords
    circuit optimisation; circuit simulation; linear matrix inequalities; linear systems; semiconductor device models; black-box solver; circuit reliability; circuit simulation; large sparse unsymmetric linear systems; low memory-footprint; preconditioned iterative solvers; semiconductor device; short solution time; sparse solver; unsymmetric matrix permutations; unsymmetric permutations; unsymmetric scalings; Charge carrier processes; Circuit simulation; Couplings; Differential equations; Electrostatics; Linear systems; Nonlinear equations; Partial differential equations; Semiconductor devices; Sparse matrices;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2004.823345
  • Filename
    1269862