Title :
A delay metric for RC circuits based on the Weibull distribution
Author :
Liu, F. ; Kashyap, C. ; Alpert, C.J.
Author_Institution :
IBM Austin Res. Lab., TX, USA
fDate :
3/1/2004 12:00:00 AM
Abstract :
Physical synthesis optimizations require fast and accurate analysis of RC networks. Elmore first proposed matching circuit moments to a probability density function (PDF), which led to widespread adoption of his simple and fast metric. The more recently proposed PRIMO and H-gamma metrics match the circuit moments to the PDF of a Gamma statistical distribution. We instead propose to match the circuit moments to a Weibull distribution and derive a new delay metric called Weibull-based delay (WED). The primary advantages of WED over PRIMO and H-gamma are its efficiency and ease of implementation. Experiments show that WED is robust and has satisfactory accuracy at both near- and far-end nodes.
Keywords :
Weibull distribution; circuit optimisation; circuit simulation; networks (circuits); Gamma statistical distribution; H-gamma metrics; PRIMO; RC circuits; RC network analysis; Weibull distribution; Weibull-based delay; delay metric; far-end node; matching circuit moments; near-end node; physical synthesis optimizations; probability density function; Circuit synthesis; Delay effects; Network synthesis; Probability density function; Propagation delay; RLC circuits; Robustness; Shape; Statistical distributions; Weibull distribution;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2004.823343