DocumentCode :
911024
Title :
A pipelined temporal difference imager
Author :
Gruev, Viktor ; Etienne-Cummings, Ralph
Author_Institution :
Electr. & Comput. Eng. Dept., Johns Hopkins Univ., Baltimore, MD, USA
Volume :
39
Issue :
3
fYear :
2004
fDate :
3/1/2004 12:00:00 AM
Firstpage :
538
Lastpage :
543
Abstract :
A 189×182 active pixel sensor (APS) for temporal difference computation is presented. The temporal difference imager (TDI), fabricated in 0.5-μm CMOS process, contains in-pixel storage elements for a previous image frame. Difference double-sampling circuits are used to suppress the fixed pattern noise in both images and to compute the difference between the corrected images. The pixel area occupies 25 μm by 25 μm (using 0.7-μm scalable rules), with fill factor of 30%. A novel pipelined readout technique is described, which is used to improve the accuracy of the temporal difference computation. With this pipelined readout architecture, >8-bit precision for the difference image and low spatial droop across the difference image is achieved. The chip consumes 30 mW at 50 fps from a 5-V power supply.
Keywords :
CMOS image sensors; sampled data circuits; 182 pixel; 189 pixel; 25 micron; 30 mW; 5 V; CMOS process; active pixel sensor; difference double-sampling circuits; fill factor; fixed pattern noise; image frame; in-pixel storage elements; pipelined readout architecture; pipelined readout technique; pipelined temporal difference imager; power consumption; power supply; spatial droop; temporal difference computation; Atmosphere; Atmospheric waves; Circuits; Computer architecture; Delay effects; Image storage; Layout; Leakage current; Phase distortion; Video compression;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.822777
Filename :
1269933
Link To Document :
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