DocumentCode
911093
Title
A O(t 3+|E |) fault identification algorithm for diagnosable systems
Author
Sullivan, Gregory F.
Author_Institution
Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD, USA
Volume
37
Issue
4
fYear
1988
fDate
4/1/1988 12:00:00 AM
Firstpage
388
Lastpage
397
Abstract
Systems composed of many processing units can use these units to help perform self-diagnosis. An algorithm is presented that performs this type of diagnosis for the system-level fault model. The time complexity of the algorithm is O(t 3+|E |), where |E | is the number of tests and t is the number of allowed faults. When t is small relative to the total number of system components n , this is the tightest known time bound; when t is O(n 5/6) this is the best bound
Keywords
fault tolerant computing; diagnosable systems; fault identification algorithm; time complexity; Built-in self-test; Computer science; Fault diagnosis; Hardware; Labeling; Performance evaluation; System testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.2182
Filename
2182
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