DocumentCode
911110
Title
Quasilinear formulation with a simple remeshing scheme for the finite element based simulation of dopant diffusion in silicon
Author
Amaratunga, G.A.J. ; Ismail, R.
Author_Institution
University of Southampton, Department of Electronics and Information Engineering, Southampton, UK
Volume
133
Issue
6
fYear
1986
fDate
12/1/1986 12:00:00 AM
Firstpage
221
Lastpage
228
Abstract
The weighted residual formulation of the finite-element method is used to solve the nonlinear diffusion equation which describes dopant diffusion. Discretisation in the time domain is carried out using the Crank-Nicolson implicit scheme. A remeshing scheme based on a continuity criterion obtained by comparing the concentration values of adjacent nodes is used to introduce or eliminate nodes in the spatial domain as the diffusion proceeds in time. This scheme which uses an average diffusivity across each element has been successfully applied to the simulation of As diffusion in Si, and overcomes the oscillation and instability which would otherwise occur if a uniform mesh with the same number of nodes were used.
Keywords
arsenic; diffusion in solids; doping profiles; elemental semiconductors; finite element analysis; silicon; Crank-Nicolson implicit scheme; Si:As; continuity criterion; dopant diffusion; finite element based simulation; nonlinear diffusion equation; quasilinear formulation; remeshing scheme; semiconductor; time domain discretisation; weighted residual formulation;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Proceedings I
Publisher
iet
ISSN
0143-7100
Type
jour
DOI
10.1049/ip-i-1.1986.0046
Filename
4644234
Link To Document