• DocumentCode
    911303
  • Title

    Optimisation of four-and five-layer Alx Ga1-x As/GaAs large optical cavity lasers for high power, low threshold current density operation

  • Author

    Garrett, B. ; Whiteaway, J.E.A.

  • Author_Institution
    Standard Telecommunication Laboratories Ltd., Harlow, UK
  • Volume
    133
  • Issue
    5
  • fYear
    1986
  • fDate
    10/1/1986 12:00:00 AM
  • Firstpage
    319
  • Lastpage
    326
  • Abstract
    A detailed optimisation procedure is described for high power, low threshold current density operation of asymmetric four-and five-layer large optical cavity lasers. The analysis of these multilayer waveguides is simplified by using a computer model based on an admittance transformation technique, commonly used in microwave circuit analysis. Effects of compositional and thickness variations on the waveguiding properties are described. The maximum obtainable output power scales with the width of the waveguide, although this results in an increase in threshold current density due to the decreased coupling between the optical distribution and the active layer. If the structure is designed to guide light in the absence of the active layer then the sensitivity of the optical properties to changes in active layer thickness is reduced, providing the active layer is kept thin. Examples of optimised structures are given to illustrate the effects various structural changes have on the optical properties of the device and on the threshold current density.
  • Keywords
    III-V semiconductors; aluminium compounds; current density; gallium arsenide; laser cavity resonators; semiconductor junction lasers; AlxGa1-xAs-GaAs; AlxGa1-xAs/GaAs large optical cavity lasers; III-V semiconductors; LOC laser; active layer; admittance transformation technique; compositional variations; computer model; five-layer; four-layer; high power; low threshold current density operation; multilayer waveguides; optical distribution; optical property sensitivity; optimisation; structural changes; thickness variations; Optoelectronics, Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings J
  • Publisher
    iet
  • ISSN
    0267-3932
  • Type

    jour

  • DOI
    10.1049/ip-j.1986.0055
  • Filename
    4644253