Title :
A Framework for an Integrated Set of Standards for Ionizing Radiation Testing of Microelectronics
Author :
Brown, Dennis B. ; Johnston, Allan H.
Author_Institution :
Condensed Matter Physics Branch Naval Research Laboratory Washington, DC 20375
Abstract :
Post irradiation effects necessitate modifications to total dose testing procedures. A test methodology based on three options is proposed: (a) Test Method 1019, (b) Method 1019 with safety factors, (c) and a new test method based on extrapolation from measurements to effects expected at time of threat.
Keywords :
Annealing; Extrapolation; Ionizing radiation; Laboratories; Microelectronics; Physics; Radiation safety; Space technology; Testing; Time measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337543
