DocumentCode :
913752
Title :
Experiments on heat sinking of semiconductor devices
Author :
Fallmann, W. ; Hartnagel, H.L. ; Mathur, P.C.
Author_Institution :
University of Newcastle upon Tyne, Department of Electrical & Electronic Engineering, Newcastle upon Tyne, UK
Volume :
7
Issue :
18
fYear :
1971
Firstpage :
512
Lastpage :
513
Abstract :
A planar GaAs structure has been used to measure the properties of good heatsinks of c.w. devices. It is found, first, that the thermal resistance is primarily given by the thermal conductivity k of GaAs if the temperature dependence of k is included, and, secondly, that the contribution of the semiconductor-metal interface is negligible.
Keywords :
heat sinks; resistance (electric); semiconductor devices; conductivity; heatsinks; planar GaAs structure; semiconductor devices; semiconductor metal interfaces; thermal resistance;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19710347
Filename :
4235247
Link To Document :
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