• DocumentCode
    915486
  • Title

    SPIDER -- A CAD System for Modeling VLSI Metallization Patterns

  • Author

    Hall, Joseph E. ; Hocevar, Dale E. ; Yang, Ping ; Mcgraw, Michael J.

  • Author_Institution
    Semiconductor Process and Design Center, Texas Instruments, Inc., Dallas, TX, USA
  • Volume
    6
  • Issue
    6
  • fYear
    1987
  • fDate
    11/1/1987 12:00:00 AM
  • Firstpage
    1023
  • Lastpage
    1031
  • Abstract
    A system of CAD programs, called SPIDER, for ensuring adequate current-carrying capacity in VLSI circuits has been developed. The approach is hierarchical, and it automates and simplifies many of the tasks previously performed by the circuit designer. The system converts transient current waveforms into dc electromigration equivalent values, and includes an algorithm for determining the line width adjustments necessary for meeting specified median-time-to-failure (MTF) requirements. SPIDER also computes voltage drops with respect to a reference node and calls upon an optimization algorithm for correcting violations of a voltage drop specification.
  • Keywords
    Circuit analysis; Conductors; Current density; Design automation; Electromigration; Finite element methods; Instruments; Metallization; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1987.1270343
  • Filename
    1270343