DocumentCode
915486
Title
SPIDER -- A CAD System for Modeling VLSI Metallization Patterns
Author
Hall, Joseph E. ; Hocevar, Dale E. ; Yang, Ping ; Mcgraw, Michael J.
Author_Institution
Semiconductor Process and Design Center, Texas Instruments, Inc., Dallas, TX, USA
Volume
6
Issue
6
fYear
1987
fDate
11/1/1987 12:00:00 AM
Firstpage
1023
Lastpage
1031
Abstract
A system of CAD programs, called SPIDER, for ensuring adequate current-carrying capacity in VLSI circuits has been developed. The approach is hierarchical, and it automates and simplifies many of the tasks previously performed by the circuit designer. The system converts transient current waveforms into dc electromigration equivalent values, and includes an algorithm for determining the line width adjustments necessary for meeting specified median-time-to-failure (MTF) requirements. SPIDER also computes voltage drops with respect to a reference node and calls upon an optimization algorithm for correcting violations of a voltage drop specification.
Keywords
Circuit analysis; Conductors; Current density; Design automation; Electromigration; Finite element methods; Instruments; Metallization; Very large scale integration; Voltage;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.1987.1270343
Filename
1270343
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