• DocumentCode
    915772
  • Title

    Sequential Monte Carlo for Bayesian matching of objects with occlusions

  • Author

    Tamminen, Toni ; Lampinen, Jouko

  • Author_Institution
    Lab. of Comput. Eng., Helsinki Univ. of Technol., Espoo, Finland
  • Volume
    28
  • Issue
    6
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    930
  • Lastpage
    941
  • Abstract
    We consider the problem of locating instances of a known object in a novel scene by matching the fiducial features of the object. The appearance of the features and the shape of the object are modeled separately and combined in a Bayesian framework. In this paper, we present a novel matching scheme based on sequential Monte Carlo, in which the features are matched sequentially, utilizing the information about the locations of previously matched features to constrain the task. The particle representation of hypotheses about the object position allow matching in multimodal and cluttered environments, where batch algorithms may have convergence difficulties. The proposed method requires no initialization or predetermined matching order, as the sequence can be started from any feature. We also utilize a Bayesian model to deal with features that are not detected due to occlusions or abnormal appearance. In our experiments, the proposed matching system shows promising results, with performance equal to batch approaches when the target distribution is unimodal, while surpassing traditional methods under multimodal conditions. Using the occlusion model, the object can be localized from only a few visible features, with the nonvisible parts predicted from the conditional prior model.
  • Keywords
    Bayes methods; Monte Carlo methods; convergence; image matching; image representation; Bayesian matching; abnormal appearance; batch algorithms; conditional prior model; convergence difficulties; fiducial features; occlusion model; particle representation; sequential Monte Carlo; sequential matching; unimodal target distribution; Bayesian methods; Convergence; Deformable models; Graphical models; Layout; Monte Carlo methods; Pattern recognition; Predictive models; Sampling methods; Shape; Monte Carlo simulation.; Object recognition; statistical models in pattern recognition; Algorithms; Artificial Intelligence; Bayes Theorem; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Models, Biological; Models, Statistical; Monte Carlo Method; Pattern Recognition, Automated; Subtraction Technique;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2006.128
  • Filename
    1624357