ASIC reliability and qualification: a user´s perspective

The process of qualifying an application-specific integrated circuit (ASIC) such as gate arrays of standard cells, that is used in product development at the IBM Rochester, Minnesota, development laboratory is reviewed. The emphasis is on reliability and its evaluation during the qualification process. The varying degrees of involvement in qualification activities that a supplier has had over the last few years are outlined. These qualification activities, such as technology qualification, specific part number qualifications, supplier process surveys, part construction analysis, and failure rate projections, are discussed. Postqualification expectations in terms of burn-in, reliability monitors, and reliability growth goals are also discussed