Title :
Precise Dielectric Measurements of Low-Loss Materials at Millimeter and Submillimeter Wavelengths
Author :
Afsar, M.N. ; Chantry, G.W.
fDate :
6/1/1977 12:00:00 AM
Abstract :
Transmission dispersive Fourier transform, spectrometry (DFTS) has been used for the measurements of both real and imaginary parts of the complex relative permittivity of low-loss materials at millimeter and submillimeter wavelengths. The materials investigated include cis and trans decalin and polypropylene.
Keywords :
Dielectric materials; Dielectric measurements; Discrete Fourier transforms; Dispersion; Fourier transforms; Permittivity measurement; Spectroscopy; Submillimeter wave measurements; Submillimeter wave propagation; Wavelength measurement;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1977.1129147
