DocumentCode :
916183
Title :
A simple on-chip repetitive sampling setup for the quantification of substrate noise
Author :
De Wilde, Michiel ; Meeus, Wim ; Rombouts, Pieter ; Van Campenhout, Jan
Author_Institution :
Dept. of Electron. & Inf. Syst., Ghent Univ., Gent, Belgium
Volume :
41
Issue :
5
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
1062
Lastpage :
1072
Abstract :
The quantification of substrate noise is an important issue in mixed-signal designs, where sensitive analog circuits are embedded in a hostile digital environment. In this paper we present an experimental environment to characterize the sensitivity of embedded analog circuits to digitally generated substrate noise. Our measurement technique is based on equivalent-time substrate voltage sampling and uses a simple differential latch comparator without explicit input sample-and-hold. A surprisingly large measurement bandwidth is observed,which is explained from the detailed circuit behavior. On our 0.18-μm CMOS test chip,we have demonstrated that our system allows to wave trace pulses as narrow as 200 ps accurately. Additionally, the extraction of precise measurement data from observations that are excessively corrupted by additive noise and timing jitter is addressed. We present simple yet very effective methods to accurately reconstruct pulse waveform features without the use of delicate deconvolution operations.
Keywords :
CMOS integrated circuits; comparators (circuits); integrated circuit measurement; integrated circuit noise; integrated circuit testing; mixed analogue-digital integrated circuits; timing jitter; 0.18 micron; 200 ps; CMOS integrated circuits; CMOS test chip; additive noise; differential amplifiers; differential latch comparator; equivalent-time substrate voltage sampling; integrated circuit noise; mixed-signal designs; on-chip repetitive sampling; sensitive analog circuits; substrate noise quantification; timing jitter; Analog circuits; Character generation; Circuit noise; Latches; Measurement techniques; Noise generators; Sampling methods; Semiconductor device measurement; Voltage; Working environment noise; CMOS integrated circuits; differential amplifiers; integrated circuit noise; jitter;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2006.872873
Filename :
1624395
Link To Document :
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