• DocumentCode
    917583
  • Title

    Concurrent detection of erroneous responses in linear analog circuits

  • Author

    Stratigopoulos, Haralampos-G D. ; Makris, Yiorgos

  • Author_Institution
    Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
  • Volume
    25
  • Issue
    5
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    878
  • Lastpage
    891
  • Abstract
    This paper presents a novel methodology for concurrent error detection in linear analog circuits. The error-detection circuit monitors the input and some observable internal nodes of the examined circuit and generates an estimate of its output. The estimate coincides with the output in error-free operation, while in the presence of errors, it diverges. Thus, concurrent error detection is performed by comparing the two signals through an analog comparator. In essence, the error-detection circuit operates as a duplicate of the examined circuit, yet it is smaller, in general, and never exceeds the size of an actual duplicate. The proposed methodology is demonstrated on three analog filters.
  • Keywords
    analogue circuits; circuit testing; comparators (circuits); error detection; filters; analog comparator; analog filters; analog test; concurrent detection; erroneous responses; error detection circuit; error-free operation; linear analog circuits; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Error-free operation; Fault detection; Filters; Manufacturing; Monitoring; System testing; Analog test; concurrent error detection; linear analog circuits; state observation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.855962
  • Filename
    1624520