DocumentCode
917583
Title
Concurrent detection of erroneous responses in linear analog circuits
Author
Stratigopoulos, Haralampos-G D. ; Makris, Yiorgos
Author_Institution
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
Volume
25
Issue
5
fYear
2006
fDate
5/1/2006 12:00:00 AM
Firstpage
878
Lastpage
891
Abstract
This paper presents a novel methodology for concurrent error detection in linear analog circuits. The error-detection circuit monitors the input and some observable internal nodes of the examined circuit and generates an estimate of its output. The estimate coincides with the output in error-free operation, while in the presence of errors, it diverges. Thus, concurrent error detection is performed by comparing the two signals through an analog comparator. In essence, the error-detection circuit operates as a duplicate of the examined circuit, yet it is smaller, in general, and never exceeds the size of an actual duplicate. The proposed methodology is demonstrated on three analog filters.
Keywords
analogue circuits; circuit testing; comparators (circuits); error detection; filters; analog comparator; analog filters; analog test; concurrent detection; erroneous responses; error detection circuit; error-free operation; linear analog circuits; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Error-free operation; Fault detection; Filters; Manufacturing; Monitoring; System testing; Analog test; concurrent error detection; linear analog circuits; state observation;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2005.855962
Filename
1624520
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