DocumentCode :
920033
Title :
MTBF of a complex binary coherent system
Author :
Kim, Chul
Author_Institution :
Agency for Defense Dev., Daejeon, South Korea
Volume :
38
Issue :
4
fYear :
1989
fDate :
10/1/1989 12:00:00 AM
Firstpage :
411
Lastpage :
415
Abstract :
It is noted that there has yet been no detailed study of the relationships between the MTBF (mean time between failures) of a system and the sequences of component failures, except for the case of a series system where every component failure causes a system failure. The author defines MTBF anew and derives relationships between the properties of the MTBF of a binary coherent system and the properties of the sequences of component failures, assuming that the lifetime distributions of the components are either new-better-than-used (NBU) exponential or increasing failure rate (IFR). Lower bounds of MTBF that can be used to predict the MTBF and to decide whether the system would satisfy the MTBF requirement are derived
Keywords :
failure analysis; reliability theory; MTBF; complex binary coherent system; component failure sequences; increasing failure rate; lifetime distributions; mean time between failures; new-better-than-used exponential distribution; reliability; Failure analysis; Random variables; Reliability theory; Stochastic processes; Weapons;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.46452
Filename :
46452
Link To Document :
بازگشت