DocumentCode
9204
Title
Fatigue Reliability Analysis of Sn–Ag–Cu Solder Joints Subject to Thermal Cycling
Author
Che, F.X. ; Pang, J.H.L.
Author_Institution
Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume
13
Issue
1
fYear
2013
fDate
Mar-13
Firstpage
36
Lastpage
49
Abstract
In this paper, thermal cycling tests and finite-element analysis (FEA) for a plastic ball grid array package with Sn-3.8Ag-0.7Cu lead-free solder joints have been performed. The solder joint fatigue lives were predicted and compared by using different 2-D and 3-D FEA models. The effects of solder constitutive models and fatigue life models on solder fatigue life prediction have been investigated. In order to obtain fatigue parameters, new averaging volumes were proposed for the solder fatigue life prediction. Different reference temperatures were simulated to investigate its effect on the solder fatigue life prediction. The effect of intermetallic compound thickness on solder joint fatigue life prediction was also investigated.
Keywords
ball grid arrays; fatigue; finite element analysis; plastic packaging; silver compounds; solders; tin compounds; 2D FEA model; 3D FEA model; Sn-Ag-Cu; fatigue life model; fatigue reliability analysis; finite-element analysis; intermetallic compound thickness; lead-free solder joint; plastic ball grid array package; solder constitutive model; solder fatigue life prediction; solder joint fatigue life prediction; thermal cycling test; Creep; Electronic packaging thermal management; Fatigue; Mathematical model; Predictive models; Soldering; Fatigue reliability; finite-element (FE) modeling; lead-free solder; life prediction; thermal cycling (TC);
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2012.2195007
Filename
6185649
Link To Document