• DocumentCode
    9204
  • Title

    Fatigue Reliability Analysis of Sn–Ag–Cu Solder Joints Subject to Thermal Cycling

  • Author

    Che, F.X. ; Pang, J.H.L.

  • Author_Institution
    Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • Volume
    13
  • Issue
    1
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    36
  • Lastpage
    49
  • Abstract
    In this paper, thermal cycling tests and finite-element analysis (FEA) for a plastic ball grid array package with Sn-3.8Ag-0.7Cu lead-free solder joints have been performed. The solder joint fatigue lives were predicted and compared by using different 2-D and 3-D FEA models. The effects of solder constitutive models and fatigue life models on solder fatigue life prediction have been investigated. In order to obtain fatigue parameters, new averaging volumes were proposed for the solder fatigue life prediction. Different reference temperatures were simulated to investigate its effect on the solder fatigue life prediction. The effect of intermetallic compound thickness on solder joint fatigue life prediction was also investigated.
  • Keywords
    ball grid arrays; fatigue; finite element analysis; plastic packaging; silver compounds; solders; tin compounds; 2D FEA model; 3D FEA model; Sn-Ag-Cu; fatigue life model; fatigue reliability analysis; finite-element analysis; intermetallic compound thickness; lead-free solder joint; plastic ball grid array package; solder constitutive model; solder fatigue life prediction; solder joint fatigue life prediction; thermal cycling test; Creep; Electronic packaging thermal management; Fatigue; Mathematical model; Predictive models; Soldering; Fatigue reliability; finite-element (FE) modeling; lead-free solder; life prediction; thermal cycling (TC);
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2012.2195007
  • Filename
    6185649