DocumentCode :
920591
Title :
Memory characteristics of p type-germanium/n type-cadmium-sulphide heterojunctions
Author :
Duncan, W.
Author_Institution :
University of Glasgow, Department of Electronics & Electrical Engineering, Glasgow, UK
Volume :
8
Issue :
26
fYear :
1972
Firstpage :
636
Lastpage :
637
Abstract :
The V/I characteristics of p Ge-n CdS heterojunctions exhibit a hysteresis or memory characteristic which is the result of two diode conduction states of resistances 106 and 10¿. The device switches from the high to the low state in less than 30 ns under reverse bias, and resetting to the high-resistance state occurs in less than 100 ns when a threshold forward bias current is exceeded. In either state, the device retains its state for periods greater than two weeks and appears to have potential application as a fast, nonvolatile memory element.
Keywords :
germanium; hysteresis; p-n heterojunctions; semiconductor storage devices; sodium compounds; Hysteresis; V/I characteristics; memory characteristics; n-CdS; p-Ge; p-n heterojunctions; semiconductor storage devices;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19720460
Filename :
4235928
Link To Document :
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