مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

921580

Title :

Barium Tetratitanate MIC Technology

Author :

Lee, Young Soo ; Getsinger, William J. ; Sparrow, Lawrence R.

Volume :

Issue :

fYear :

1979

fDate :

7/1/1979 12:00:00 AM

Firstpage :

655

Lastpage :

660

Abstract :

Experimental results on BaTi₄O₉ microwave integrated circuit (MIC) characteristics, including microstrip dispersion and loss, have shown excellent agreement with the theoretical predictions. Precision measurements of temperature stability were conducted at 14 GHz. The high dielectric constant (epsilon_r = 37) and its negative temperature coefficient can be used in specialized MIC´s for application to advanced microwave subsystems.

Keywords :

Barium; Dielectric measurements; Dielectric substrates; Electromagnetic heating; Metallization; Microstrip; Microwave integrated circuits; Propagation losses; Resonator filters; Temperature;

fLanguage :

English

Journal_Title :

Microwave Theory and Techniques, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9480

Type :

jour

DOI :

10.1109/TMTT.1979.1129696

Filename :

1129696

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=921580