• DocumentCode
    922580
  • Title

    DC built-in self-test for linear analog circuits

  • Author

    Chatterjee, Abhijit ; Kim, Bruce C. ; Nagi, Naveena

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    13
  • Issue
    2
  • fYear
    1996
  • Firstpage
    26
  • Lastpage
    33
  • Abstract
    DC testing of analog circuits is cheaper than AC testing and covers many fault classes, including some that AC tests cannot detect. This efficient, low-cost, built-in self-test (BIST) methodology uses the checksum encodings of matrix representations to uncover faults that affect a circuit´s DC transfer function
  • Keywords
    analogue integrated circuits; built-in self test; encoding; transfer functions; BIST; DC built-in self-test; DC transfer function; checksum encodings; fault classes; linear analog circuits; matrix representations; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Filters; Laplace equations; Tellurium; Transfer functions; Vectors;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.500198
  • Filename
    500198
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=922580